Scanning Electron Microscopy

The Scanning Electron Microscopy Course 2014 took place at the AO Research Institute Davos (ARI) in September.

30 September 2014

SEM Course 2014 participants with lecturer Geoff Richards (left) and Dr Iolo ap Gwynn (2nd left) in front of the AO Center in Davos.

A two-day course on Scanning Electron Microscopy (SEM) took place at the AO Research Institute Davos (ARI) on September 15–16, 2014. Nineteen participants from ARI and collaborative institutions such as the Swiss Institute of Allergy and Asthma Research in Davos (SIAF), the University of Fribourg and the University Ramon Llull, Barcelona, Spain, were able to learn from the experienced lecturers. The course was given by Prof Dr Geoff Richards in collaboration with Dr Iolo ap Gwynn of the University of Wales, Aberystwyth, Wales. They provided the attendees with entertaining and very intensive lectures describing the physical basics of SEM, the methodological approach to SEM sample preparation and analysis, and showed many examples demonstrating the importance of specimen preparation and imaging parameters on the produced images quality. Furthermore, questions on reported results and ideas could be exchanged.​​​​



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